Sematech
steps up postoptical litho research with pending installation of extreme-UV
tool
International Sematech once again has tapped a U.K.-based vendor to
help with the consortium's efforts to develop postoptical photoresists.
Hoping to further speed development of the NGL infrastructure, the
consortium has purchased the first MS-13 extreme-UV Microstepper from
Exitech of Oxford, England. The tool will be installed during the
fourth quarter of 2003 at Sematech's Resist Test Center in Austin,
TX.
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THE NEXT STEP:
A technician in International Sematech's Resist Test Center
readies wafers for the 157-nm Exitech Microstepper. The system
produces features down to 100 nm and below.
PHOTO COURTESY OF INTL. SEMATECH
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The
MS-13 will use a dense-plasma-focus discharge source from San Diegobased
Cymer. The source has a 13.5-nm wavelength and an EUV imaging lens
with a numerical aperture of 0.3. A team from Lawrence Livermore National
Laboratory, Sandia National Laboratory, and Carl Zeiss Semiconductor
Manufacturing Technologies built the lens. Sematech says the mirrors
of the 0.3-NA lens will be polished to 0.2 nm, or the smoothness of
a single atom. Coated with specially made reflective layers, the lens
will be aligned with a wavefront error of less than 1 nm, according
to the consortium.
Since April 2000, the Sematech center has been using Exitech's MS-157
Microstepper for 157-nm photoresist development. The system processes
an average of 50 wafers and 5 to 15 photoresist formulations per day,
over the course of two shifts.
Malcolm Gower, chairman and technical director of Exitech, says the
developmental program will enable the semiconductor industry to meet
manufacturing requirements for 16-Gb memory and 6-GHz chips with linewidths
down to 4565 nm.