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MicroMagazine.com

INDUSTRY NEWS

Institute seeks to speed carbon nanotube transistor use with first test-method standard

A standard under development by IEEE may expedite the use of carbon nanotubes in next-generation ICs. A working group from the institute is attempting to define electrical test methods for individual carbon nanotubes for the first time. Such a standard would determine a common metrics basis for research into the use of the material in transistors, the group says.

The chairman of the IEEE P1650 Working Group notes that researchers are already engaging in "an impressive amount" of work into using nanotubes as transistors. Daniel Gamota particularly singles out a program at the National Science Foundation under the foundation's Network for Computational Nanotechnology project.

BIG NEWS: IEEE's proposed standard would define electrical test methods for the first time. This image from a Georgia Tech research program shows one long nanotube protruding from a bundle used to measure conductance phenomena.

IMAGE COURTESY OF GEORGIA TECH

"These efforts have surfaced a strong need for common ways to evaluate the electrical characteristics of nanotubes, so what is done by one group can be confirmed by others," Gamota emphasizes. "IEEE P1650 will seek to meet this need. Our goal is to speed the emergence of nanotubes in next-generation circuitry."

Gamota says the test methods will act as a bridge between the lab and fab, allowing researchers to "communicate effectively with the engineers and circuit designers who will create commercial nanotube applications."

The working group's secretary, Paul Brazis, says the standard will focus on electrical properties such as conductivity, Hall effect, and superconducting values. Other issues related solely to transistors, such as output curve and transfer function, also will receive attention.

The working group is encouraging experts in the chemistry and physics of carbon nanotubes and electronic devices from universities, industry, and government to take part in its first meeting. The IEEE P1650 Working Group plans to convene in September at the institute's headquarters in Piscataway, NJ. The date will be announced.

Sponsored by the IEEE Nanotechnology Council, the draft document is titled Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes. Information: http://grouper.ieee.org/groups/1650.


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