L-Edit MEMS Design from Tanner EDA adds all-angle
design-rule checking (DRC) capability to the company's L-Edit MEMS
software. Using DRC, users can find out instantly if their
designs violate the rules for standard or custom fabrication processes.
DRC enables designers to check for minimum spacing between any type
of polygonal object on various layers. Violations are highlighted
when they are made. Users can also create customized DRC rules to
meet proprietary MEMS fabrication processes. Developing and maintaining
technology files is easily manageable through a series of design setup
dialog boxes. As designers create more SoC configurations requiring
electrical and mechanical devices on the same chip, the design package
enables them to handle MEMS and IC design simultaneously. Information:
Air Liquide Balazs Analytical Services laboratory in Corbeil-Essones,
France, has become ISO/CEI 17025 accredited, completing the accreditation
of the company's worldwide laboratory operations. The accreditation
certifies that the lab complies with rigorous standards in more than
100 ultratrace analytical methods. The standards certify that the
company uses well-defined test and calibration methods; performs method
validation and uncertainty measurement; and maintains measurement
transparency, reliability, and repeatability. They also ensure the
technical competence of lab personnel, who must participate in proficiency
testing programs and exhibit ethical laboratory behavior. Finally,
the standards require QA of test and calibration results. Info: www.airliquide.com.
(Semicon West, North Hall, Booth 5305)
Products has released a catalog highlighting its industrial
electronics products. Available in downloadable pdf format and on
CD-ROM, the catalog features an extensive range of quick-disconnect
couplings and fittings for secure, dry-break fluid connections in
industrial and electronic applications. The catalog features
four new product families and more than 100 new items. Product descriptions
include technical and dimensional data in both metric and fractional
formats. The catalog contains a chemical compatibility guide and a
pictorial index to guide specifiers. Information: www.colder.com.
(Semicon West, North Hall, Booth 6053)
x-ray metrology tools from Bede provide enhanced
small-spot measuring capability for 50- to 300-mm semiconductor wafers.
The new capability enables users to measure sub-100-Ám test
pads in chips and scribe lines on processed wafers. Typical
applications include epi-layer composition and thickness, polycrystalline-layer
thickness, phase and texture, pore size, and pore-size distribution.
The BedeMetrix-L measures thickness as well as the fundamental material
properties and structures of materials, including epi and nonepi layers.
Information: www.bede.com. (Semicon
West, South Hall, Booth 2814)
Ultra Analytics offers PortAll Version 2 software, expanding
the capabilities of handheld and portable particle counters. The
software enables users to organize, archive, and retrieve particle-count
data easily. It is used to track particle counts, identify
trends, and eliminate particle contamination sources. A scheduler
feature allows operators to collect particle-count data automatically.
Operators can reduce gowning frequency by detecting particles from
outside the cleanroom. The software adheres to ISO and other standards
and regulations. It also conducts rapid pass/fail reporting. Information:
brochure from Watlow details electric process heating and control
products, including electric process heaters and systems,
a control panel, a process controller, a power controller, and temperature
sensor products. The brochure highlights immersion and circulation
heaters, duct heaters, over-the-side heaters, and specialty heaters
such as ceramic-fiber and tubular radiant heaters. The brochure also
has a illustration showing the range and flexibility of the company's
offerings. Information: www.watlow.com.
(Semicon West, South Hall, Booth 2731)