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Mapping the Roadmap

Updates and analysis concerning the International Technology Roadmap for Semiconductors (IRTS)

January 1998:
The first installment of this exclusive article series begins with an overview of defect and yield hazards on the new SIA roadmap.

March 1998:
The second installment looks at the methods, impacts, issues, and challenges involved in creating yield models.

June 1998:
What drives defect detection technology?

July/August 1998:
Assessing future technology requirements for rapid isolation and sourcing of faults.

October 1998:
The series concludes with a look at the challenges facing the industry in the elimination of yield-limiting defects.


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