Mapping the Roadmap
Updates and analysis concerning the International Technology Roadmap for Semiconductors (IRTS)
The first installment of this exclusive article series begins with an overview of defect and yield hazards on the new SIA roadmap.
The second installment looks at the methods, impacts, issues, and challenges involved in creating yield models.
What drives defect detection technology?
Assessing future technology requirements for rapid isolation and sourcing of faults.
The series concludes with a look at the challenges facing the industry in the elimination of yield-limiting defects.
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